23 - 26 June 2025
Munich, Germany

Optical Metrology technical events

Focused meetings on topics related to the conference programme

Technical events

Connect with your colleagues and explore topics in depth. Events include daily sessions on technical topics and two poster sessions, collocated with SPIE Digital Optical Technologies.

Speaker at SPIE Optical Metrology technical event
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25 June 2025 • 12:30 - 13:30 CEST | ICM, Hall B0 
Conference attendees are invited to attend the poster session on Wednesday. Come view the posters, ask questions, and network with colleagues in your field.