23 - 26 June 2025
Munich, Germany

Join us for the 2025 event in Munich

Make plans to join this year's SPIE Optical Metrology event that highlights the the latest advances in optical measurement systems. It is the meeting for emerging photonics fields within measurement systems, modeling, imaging, sensing, and inspection.

Conference sessions: 23 - 26 June 2025
Courses: 22 and 26 June 2025

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Explore six great conferences

  • Optical Measurement Systems for Industrial Inspection
  • Modeling Aspects in Optical Metrology
  • Optics for Arts, Architecture, and Archaeology
  • Multimodal Sensing and Artificial Intelligence for Sustainable Future
  • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
  • Automated Visual Inspection and Machine Vision

Four days of exciting content and connecting with your community

  • Plenary talks
  • Technical presentations
  • Networking sessions
  • Course offerings

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In-person courses available

SPIE courses aligned with topics from Optical Metrology advance your career. View available courses, and add one to your conference registration.

2025 Symposium Chairs


Pietro Ferraro

ISASI-CNR (Italy)

Jörg Seewig

Technische Univ. Kaiserslautern (Germany)

SPIE Optical Metrology is part of the World of Photonics Congress


Learn more about the World of Photonics Congress

Your registration to SPIE Optical Metrology, grants you admission to all conferences held as part of the LASER World of Photonics Congress.

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