Join us for six conferences focused on measurement systems, modeling, videometrics, and inspection. Hear the latest research and share your own.
ICM - International Congress Center Messe München
Messe München GmbH, Messegelände, 81823 München, Germany
Register and hear presentations from around the world, and get access to publish work on the SPIE Digital Library.
Technical and networking events keep you abreast of the latest research and in touch with leading scientists.
Listen to top plenary presentations and learn about the latest challenges and innovations.
SPIE Student Members are encouraged to apply for supplemental travel grants and fee waivers to attend Optical Metrology. Student Members who are presenting authors will be given priority selection, but grants are open to all Student Members.
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