23 - 26 June 2025
Munich, Germany

Optical Metrology plenary events

World-class speakers on research challenges and breakthroughs

Hear from the best speakers in the industry

Optical Metrology plenary sessions feature presentations from a wide range of leaders in the field, which focus on developing research and visions of the future of laser technologies.

Plenary and keynote speakers at SPIE Optical Metrology
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23 June 2025 • 09:00 - 10:00 CEST | ICM Room 21 
Join this co-located event discussing the newest research in light diffraction for computational imaging by Aydogan Ozcan, UCLA.
23 June 2025 • 16:00 - 17:40 CEST | ICM, Saal 1 
Join us for the Symposium welcome and plenary talk on the newest research in optical metrology by Wolfgang Osten, Univ. Stuttgart and Alberto Diaspro, Univ. of Genoa and CNR-IBF