23 - 26 June 2025
Munich, Germany

SPIE Optical Metrology Technical Conferences

The premier European conference for scientists, engineers, researchers, and product developers
Technology being presented at SPIE Optical Metrology

Optical Metrology technical conferences

Come ready to discuss the latest research in measurement systems, modeling, videometrics, and inspection

Featuring six technical conferences

Optical measurement system technology

Optical Measurement Systems for Industrial Inspection

Modeling technology at SPIE Optical Metrology

Modeling Aspects in Optical Metrology

Optics technology at SPIE Optical Metrology

Optics for Arts, Architecture, and Archaeology

Multimodal sensing and artificial intelligence technology

Multimodal Sensing and Artificial Intelligence for Sustainable Future

Attendee of SPIE Optical Metrology conference

Optical Methods for Inspection, Characterization, and Imaging of Biomaterials

Automated visual inspection and machine vision technology

Automated Visual Inspection and Machine Vision

Thank you to our 2025 Optical Metrology Chairs

Pietro Ferraro

ISASI-CNR (Italy)

Jörg Seewig

Technische Univ. Kaiserslautern (Germany)