23 - 26 June 2025
Munich, Germany

SPIE Optical Metrology Programme

Learn about the programme

We are looking forward to gathering in Munich in 2025.

Review the conference topics listed below and make plans to be a part of the amazing research that will be featured.

Speaker at SPIE Optical Metrology

Experts address a variety of technologies and applications:

  • Optical measurement systems
  • Modeling aspects in optical metrology
  • Optics for arts, architecture, and archaeology
  • Multimodal sensing and artifical intelligence techologies and applications
  • Optical methods for inspection, characterization, and imaging of biomaterials
  • Automated visual inspection and machine vision

Technology presented at SPIE Optical Metrology

Registration includes 50 SPIE Digital Library downloads

Access the research you need

Presentations and manuscripts presented at Optical Metrology are published in the Proceedings of SPIE on the SPIE Digital Library.

Access the research you need

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