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5 - 10 July 2026
Copenhagen, Denmark
Conference 14145 > Paper 14145-273
Paper 14145-273

Demonstration of long-wave infrared Virtually Imaged Phased Array (VIPA)

9 July 2026 • 17:30 - 19:00 CEST | Room B4-M3

Abstract

Earth-like planets emit thermal radiation predominantly in the mid- to far-infrared, spanning roughly 4 μm to 100 μm, with a peak near 11 μm. Despite the scientific importance of this spectral region for habitable world surveys, there are currently very few spectrometers capable of operating in this regime. To address this gap, we present the design, fabrication, and experimental characterization of an air-gapped, silicon-based virtually imaged phased array (VIPA) optimized for mid-IR spectroscopy. The device consists of a 1″ wide, 3″ tall high-purity silicon plate pair with two coating configurations, gold (Au) and titanium nitride (TiN). Using quantum cascade lasers at wavelengths of 14 μm and 17 μm, paired with a THz microbolometer detector array, we characterize the VIPA’s dispersion and evaluate its resolving power. We also develop computational models to simulate the VIPA’s dispersion and expected resolving power, enabling direct comparison with the measured performance.

Presenter

National Institute of Standards and Technology (United States)
Johannes Hubmayr is Group Leader of the Long Wavelength Sensors and Applications Group at the National Institute of Standards and Technology (NIST) in Boulder. His Group designs and micro-fabricates custom cryogenic sensor arrays and multiplexed readout for applications in cosmology, astrophysics, security, and increasingly in support of quantum information science. Dr. Hubmayr’s areas of technical expertise include large-format cryogenic focal planes, transition edge sensor (TES) bolometers, microwave kinetic inductance detectors (MKIDs), millimeter-wave polarimetry, SQUID multiplexed cryogenic readout, microfabrication design, and millimeter-wave feedhorns. As of early 2023, Dr. Hubmayr’s 300+ scientific publications have been cited 11,400+ times.
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National Institute of Standards and Technology (United States)
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James A. Beall
National Institute of Standards and Technology (United States)
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Matthew A. Koc
National Institute of Standards and Technology (United States)
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Jeff van Lanen
National Institute of Standards and Technology (United States)
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John H. Lehman
National Institute of Standards and Technology (United States)
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National Institute of Standards and Technology (United States)
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Adam J. Fleisher
National Institute of Standards and Technology (United States)