Paper 14093-84
Paper 14093-84
Real-time focal spot and M2 measurement module for precision laser micro-machining applications
On demand | Presented live 15 April 2026 
Abstract
We present a novel, integrated module for real-time measurement of focal spot size and beam quality (M²) tailored to precision laser micro-machining applications. The device supports continuous-wave and ultrashort pulse lasers up to 100 W, featuring advanced power attenuation, high-resolution imaging, and a motorized translation stage for detailed caustic analysis. This compact, versatile system enhances characterization accuracy, facilitating optimization of laser-based microfabrication and additive manufacturing processes.
Presenter
Multitel A.S.B.L. (Belgium)
Emeric BIVER is French and has an international engineering Master’s Degree in Micro and Nanotechnologies and a Ph.D. on laser processes applied to printed microelectronics. He worked on laser-matter interaction, laser micromachining and laser printing of conductive inks. He has been working for 6 years in the Applied Photonics department of the Belgium research centre MULTITEL, in the micromachining team. His work involves working on laser systems, and designing and developing prototypes for micromachining systems.
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