Paper 14100-67
Paper 14100-67
Measurement and simulation-based design centering for yield optimization in photonic integrated circuits
On demand | Presented live 14 April 2026 
Abstract
This paper applies design centering to maximize the yield of grating couplers in photonic integrated circuits. 2D finite-difference time-domain simulations and on-chip experiments assess performance. Bayesian optimization, artificial neural networks and residual analysis reduce simulation needs, enabling yield-optimized geometry predictions based on typical foundry process variations. A semi-automated setup accounts for fiber-to-chip measurement uncertainty.
Presenter
Bowen Wang
University of Bristol (United Kingdom)
Bowen Wang received a BS degree from the Sichuan University of Physics and an MSc degree from the University of Bristol in 2021, where he is currently working towards a PhD in electrical and electronic engineering. His doctoral research focuses on the optimization of photonic integrated circuit components with improved yield considering fabrication and measurement error. He is also interested in Neural Networks and automatic programming for design and measurement of photonic integrated circuits.