Single, Double, Triple Slit Diffraction of Ellipse Field Singularities

Singular optics continues to attract significant interest due to its potential for advancing optical communication, imaging, and metrology. Among polarization singularities, C-points—locations of circular polarization embedded in an elliptically polarized field—represent fundamental topological entities in vector beams. These beams exhibit robust structural stability under propagation, making them promising for optical system design. In this work, we investigate the diffraction behavior and topological features of C-point singularities using single-, double-, and triple-slit configurations. Theoretical modeling is performed using the Fresnel diffraction integral, where the field at the diffraction plane is computed from the superposition of left- and right-circularly polarized vortex components with topological charges. The resulting diffraction patterns reveal polarization-dependent interference structures that encode the local topological charge distribution. The simulated analyses demonstrate distinct diffraction signatures for different C-point morphologies, offering a new approach for their identification and control. These findings provide insight into the interaction between topology and diffraction in vector beams and suggest practical avenues for integrating singular beam structures into polarization-based optical system design, optical communication, and metrology applications.