Paper 14037-37
Line-array SWIR image sensor for the next generation of spectroscopy
29 April 2026 • 10:40 AM - 11:00 AM EDT | National Harbor 10
Abstract
Short-Wave Infrared (SWIR) line arrays are essential components in high-end spectroscopy, enabling the acquisition of hyperspectral data across the near-infrared and short-wave spectrums. To detect weak intrinsic signals in these ranges, achieving both high sensitivity and high spatial resolution is critical. However, optimizing these parameters often requires a relatively large photosensitive area, which inherently degrades injection efficiency and increases dark current. This article presents advanced design methodologies for Readout Integrated Circuits (ROICs) tailored for InGaAs-based SWIR sensors. We propose specific circuit techniques to mitigate these conflicting requirements, ensuring high-performance signal acquisition without compromising detector efficiency or noise performance.
Presenter
Raf Schoofs Sr.
Exosens S.A.S. (Belgium)
Raf Schoofs received his Master’s and PhD degrees in Electronic Engineering from KU Leuven, Belgium. His doctoral research focused on high-speed continuous-time Delta-Sigma ADCs, leading to several publications at prestigious international conferences.
Following his PhD, Raf served as an ASIC and System Lead Design Engineer within the RF sector, specializing in telecommunications applications for companies in both Belgium and New Zealand.
More recently, Raf held a key role within the CMOS Image Sensor R&D division at ON Semiconductor. He currently serves as the Vice President of Sensor R&D at Exosens (formerly Xenics), where he leads the development of advanced infrared imaging solutions for global industrial and defense markets.