Paper 14037-13
Enhancing temperature measurement accuracy of SOI diode uncooled IRFPA in shutterless operation using mathematical optimization
27 April 2026 • 2:10 PM - 2:30 PM EDT | National Harbor 10
Abstract
This study presents two investigations focused on shutterless operation and temperature measurement accuracy in an 80×60 pixel SOI diode infrared focal plane array(IRFPA). An improved shutterless correction technique was developed, allowing for the generation of a reference image from a single data acquisition in a stable environment, thus avoiding real-time updates and reducing computational load. Additionally, parameters for aberration correction were optimized using the Nelder-Mead method, achieving a temperature measurement error within 1°C for subjects between 10°C and 50°C. Ultimately, a shutterless infrared camera with high temperature accuracy was successfully created through a simple onetime correction process.
Presenter
Yusuke Daikoku
Mitsubishi Electric Corp. (Japan)
DAIKOKU Yusuke received his B.S. and M.S. degrees in physics from Department of Physics and Graduate School of Science, Kyoto University, Japan, in 2022 and 2024 respectively.
He has been with the Advanced Technology R&D Center, Mitsubishi Electric Corporation, Amagasaki, Japan, since 2024.
He works on the development of silicon-based infrared sensors for use in the long-wavelength infrared region.