Compact high-resolution MWIR detectors at SCD

SemiConductor Devices (SCD) is advancing the development of compact, high-resolution cooled mid-wave infrared (MWIR) detectors to meet the growing demand for superior imaging performance in size-, weight-, and power-constrained (SWaP) systems. This paper presents the design, fabrication, and characterization of SCD’s latest MWIR focal plane arrays (FPAs) featuring pixel pitches of 10 μm and 5 μm. These detectors employ advanced device design, hybridization with low-noise readout integrated circuits (ROICs), and optimized packaging techniques to achieve exceptional image quality in compact formats. Cryogenic operation is supported by both integral rotary and split linear cryocoolers, providing system design flexibility, long-life reliability, and compatibility with a variety of platform environment conditions. Performance characterization demonstrates high operability, excellent modulation transfer function (MTF), and low noise-equivalent temperature difference (NETD), confirming that pixel scaling maintains sensitivity and uniformity. The resulting compact cooled MWIR detector modules enable next-generation electro-optical systems with enhanced spatial resolution, high thermal sensitivity, and reduced system footprint, supporting a wide range of defense, aerospace, and commercial applications.