Prof. Jovan G. Brankov

Dr. Jovan G. Brankov is a Professor in the Departments of Electrical and Computer Engineering and Biomedical Engineering at the Illinois Institute of Technology. His research spans medical imaging (software and hardware), machine and deep learning. Current projects include medical image quality assessment using human-observer models, multiple-image radiography (a novel phase-sensitive X-ray imaging method), advanced 4D and 5D tomographic reconstruction for medical image sequences, and applications of deep learning in medical imaging.

He is the founder of the Advanced X-ray Imaging Laboratory (AXIL) at Illinois Tech, which is developing a next-generation phase-sensitive X-ray device. Dr. Brankov serves as an Associate Editor for the IEEE Transactions on Biomedical Engineering and the Journal of Medical Imaging (SPIE) and is co-chair of the SPIE Medical Imaging Image Perception Conference.